This volume contains the proceedings of the workshop on Optimization Theory and Related Topics, held in memory of Dan Butnariu, from January 11-14, 2010, in Haifa, Israel. An active researcher in various fields of applied mathematics, Butnariu published over 80 papers. His extensive bibliography is included in this volume. The articles in this volume cover many different areas of Optimization Theory and its applications: maximal monotone operators, sensitivity estimates via Lyapunov functions, inverse Newton transforms, infinite-horizon Pontryagin principles, singular optimal control problems with state delays, descent methods for mixed variational inequalities, games on MV-algebras, ergodic convergence in subgradient optimization, applications to economics and technology planning, the exact penalty property in constrained optimization, nonsmooth inverse problems, Bregman distances, retraction methods in Banach spaces, and iterative methods for solving equilibrium problems. This volume will be of interest to both graduate students and research mathematicians.
Bringing together the research fields of sign language linguistics and information structure, this book focuses on the realization of modal and focus particles in German Sign Language, Sign Language of the Netherlands, and Irish Sign Language. The study analyzes professionally elicited data with regard to nonmanual features expressed by articulators such as the body, head, and face, and accounts for the results within existing theoretical models. The analyses contribute to recent debates about information structure and the syntax-prosody interface. Thus, this book is of special interest to both sign and spoken language linguists.
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de- scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per- formance tunning, and worst-case design. The main emphasis of the presen- tation is placed on the principles and practical solutions for performance vari- ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.
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